03/12/2004 reliability report for ds1961s dallas semiconductor 4401 south belt wood park way dallas, tx 75244-3292 prepared by:ken wendel reliability engineering manager dallas semiconductor 4401 south belt wood pk wy. dallas, tx 75244-3292email : ken. wendel@dalsemi.com ph: 972-371-3726fax: 972-371-6016 mbl: 214-435-6610 downloaded from: http:///
conclusion: ds1961s the following qualification successfully meets the quality and reliability standards required of all dallas semiconductor products and processes: module description: a description of this module can be found in the product data sheet. you can find the product data sheet at http://dbserv.maxim-ic.com/l_datasheet3.cfm.* reliability derating: a module device consists of one or more ic's in a single, upward integrated, package. this package is assembled to include batteries, crystals, and other piece parts that make up the configuration of the module. because of either the complexity of the package or the included piece parts, standard high temperature reliability testing is not possible. therefore, in order to determine the reliability of module products, the reliability of each of the piece parts is individually determined, then summed to determine the reliability of the integrated module product. if there are "n" significant components in the module then: fr (module) = fr (1) + fr (2) + fr (3) + ..... + fr (n) fr (module) = failure rate of module fr(n) = failure rate of the nth component failure rates are reported in fits (failures in time) or mttf (mean time to failure). the fit rate is related to mttf by: mttf = 1/fr note: mttf is frequently used interchangeably with mtbf. the calculated failure rate for this module/assembly is: the parameters used to calculate the module failure rate are as follows: cf: 60% ea: 0.7 b: 0 tu: 25 vu: 5.5 c volts in addition, dallas semiconductor's continuous reliability monitor program ensures that all outgoing product will continue to meet maxim's quality and reliability standards. the current status of the reliability monitor program can be viewed at http://www.maxim-ic.com/techsupport /dsreliability.html.* module device: quantity: mttf (yrs): fits: 6.3 18096 ds1961 1 6.3 18096 totals: downloaded from: http:///
the reliability data follows. a the start of this data is the module assembly information. this is a description of the module. the next section is the detailed reliability data for each stress found in the qualification / monitor. if there are additional processes or assemblies used as part of this report, a description of each will follow which includes the respective reliability data for that process/ assembly. the reliability data section includes the latest data available. some of this data may be generic with other packages or products. * some proprietary products may be excepted from this requirement. assembly site: fastech body size: 16.25mm pin count: 2 package type: ibutton f50 lead frame: pcb; fr4 assembly information: lead finsh: stainless steel glob top: fp4323, dexter hysol die attach: underfill fp4527, dexter hysol flammability: ul 94-v0 0303 0230 to date code range: electric al characterization description re adpoint condition quantity fails date code 10 iec 1000-4-2 contact 2000 volts 3 0 esd sensitivity pul's 0230 10 iec 1000-4-2 contact 4000 volts 3 0 esd sensitivity pul's 0230 10 iec 1000-4-2 contact 8000 volts 3 0 esd sensitivity pul's 0230 10 iec 1000-4-2 air 8000 volts 3 0 esd sensitivity pul's 0230 10 iec 1000-4-2 air 10000 volts 3 0 esd sensitivity pul's 0230 10 iec 1000-4-2 air 15000 volts 3 3 esd sensitivity pul's 0230 10 iec 1000-4-2 air 20000 volts 3 3 esd sensitivity pul's 0230 6 total: oper ating life description re adpoint condition quantity fails date code 1000 125c, 6.0 volts 77 0 high voltage life hrs 0230 1000 125c, 6.0 volts 77 0 high voltage life hrs 0303 0 total: temper ature cycle description re adpoint condition quantity fails date code 1000 -55c to 125c 77 0 temp cycle cys 0240 1000 -55c to 125c 77 0 temp cycle cys 0240 0 total: w/e endur ance and data ret'n description re adpoint condition quantity fails date code downloaded from: http:///
50 85 c , 5.25 volts 77 1 write cycle stress kcys 0230 1000 150c 66 0 storage life hrs 20 85 c , 5.25 volts 77 0 write cycle stress kcys 0303 1000 150c 77 0 storage life hrs 50 85 c , 5.25 volts 77 0 write cycle stress kcys 0303 1000 150c 77 2 storage life hrs 50 25 c, 5.25 volts 77 0 write cycle stress kcys 0303 1000 150c 77 0 storage life hrs 40 25 c, 5.25 volts 77 0 write cycle stress kcys 0303 1000 150c 77 1 storage life hrs 4 total: downloaded from: http:///
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